UVISEL 2

HORIBA Scientific has invented the new generation of scientific spectroscopic ellipsometer that delivers the highest level of performance for nano and micro layer characterization. The UVISEL 2 includes the widest range of integrated automated features useful for the investigation of all material family.

UVISEL PLUS

The Reference Ellipsometer for Thin Film Measurements The UVISEL Plus ellipsometer offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization. Based on a new electronic, data processing and high speed monochromator, the new FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution.

SPECTROSCOPIC ELLIPSOMETER OPTIONS AND ACCESSORIES

A large array of options and accessories is available for HORIBA Scientific’s Spectroscopic Ellipsometers to enhance and expand instrument performance and versatility. The modular design of our spectroscopic ellipsometers allows the instrument to be easily upgraded during its lifetime to best suit changing application requirements.

SMART SE

Smart SE, Powerful and Cost Effective Spectroscopic Ellipsometer The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).

AUTO SE SPECTROSCOPIC ELLIPSOMETER

imple Thin Film Measurement Tool! The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation. Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.